Electric test probes are used to establish a connection between a circuit under test and the measuring instrument

RF and microwave laminates are used as substrates for radio frequency (RF) and microwave communication systems and electronics.

Quadrature phase shift keying (QPSK) modulators and binary phase shift keying (BPSK) modulators are used to change certain characteristics (amplitude, frequency or phase) of a carrier signal in order to transmit information.

Automated test equipment (ATE) is used to monitor and control test and measurement devices, keeping human interaction at a minimum.

Environmental exposure (climatics) testing services use humidity, pressure, temperature, vibration, exposure to ultraviolet light (UV) and other climatic variables to test samples, parts and components, and finished products.

Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.

Environmental test chambers and rooms are used to ensure the reliability of industrial products, especially electronic items, through prolonged exposure to one or more environmental parameters.