Find Semiconductor Metrology Instruments Manufacturers
About Semiconductor Metrology Instruments
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. Today, semiconductor manufacturing follows very strict standards and must accommodate very small dimensions. The resulting quality control (QC) procedures and semiconductor inspection processes have resulted in the development of high-precision semiconductor metrology instruments. Many of these devices and systems use a combination of laser, optical, and electron beam technologies. As a result, these semiconductor metrology instruments can help improve quality and output at every stage of production. By using semiconductor metrology instruments, manufacturers can facilitate semiconductor inspection, reduce manufacturing costs, and shorten the product development cycle.
Engineering Web: Semiconductor Metrology Instruments - Machine Design
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Test & Instrumentation | Machine Design Field-Metrology Wells The 9140 Series of field-metrology wells provide stability to ±0. |
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Motion Control & Mechatronics | Machine Design Several new motion-control products from National Instruments, Austin (www.ni.com), promise to simplify motion-control system design. |
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Wafer reader | Machine Design a range of fab equipment, including wafer handlers, sorters, probers, metrology tools, laser markers, and ion-implant systems. |
